NXP Semiconductors N.V. enables secure connections and infrastructure for a smarter world, advancing solutions that make lives easier, better and safer. As the world leader in secure connectivity solutions for embedded applications, NXP is driving innovation in the secure connected vehicle, end-to-end security and privacy and smart connected solutions markets.
Silicon wafer production required an easy way of detecting and rejecting damaged chips at the earliest possible stage. A built-in ROM test framework allows for chip testing in the factory, with the use of test inbuilt-in the system.
What we did
Built-in chip (ROM) test framework design:
- specification of requirements,
- architectural design,
- design of security features.
Built-in chip (ROM) test framework development:
- virgin device handling
- secure card code loading to RAM and NVM
- built-in chip test procedures (ROM)
- wired communication
- security features using symetric & asymetric primitives.
Built-in chip (ROM) test framework validation:
- test plan specification,
- test specification,
- test implementation,
- automated testing.